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Al/SiO2/p-Si (MIS) YAPILARDA ARAYÜZEY DURUMLARININ YOĞUNLUK DAĞILIM PROFİLİ
ON THE DENSITY DISTRIBUTION PROFILES OF INTERFACE STATES

Ibrahim YÜCEDAĞ

Ara Yüzey Durumları, Gevşeme Zamanı, İletkenlik Yöntemi, Seri Direnç, İnce Yalıtkan Tabaka,
Interface States, Relaxation Time, Conductance Method, Series Resistance, Thin Insulator Layer,

Engineering Sciences, Year : 2009, Volume : 4, Issue : 4, Published Date : 1.10.2009

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